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Material Measurements with Vector Network Analyzers

August 16, 2022

This application note will examine the issues component and device manufacturers and their engineers will face when designing their solutions in higher frequencies.

Previous Flipbook
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in Shockline™ Vector Network Analyzer
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in Shockline™ Vector Network Analyzer

This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline ...

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Testing High Rejection Band Pass Filters for High Frequency Devices
Testing High Rejection Band Pass Filters for High Frequency Devices

The rollout of 70 GHz–80 GHz 5G systems and the subsequent need for more E-band devices (like radar sensors...