×

Download Your App Note Now

First Name
Last Name
Company Name
Country
State
City
Phone Number
Product Family
Industry
Purchasing Timeframe
Anritsu's privacy policy
 
I have read Anritsu's privacy policy
!
Thank you!
Error - something went wrong!
   

Material Measurements with Vector Network Analyzers

The increasing popularity of mobile communications, wireless data transfers, and instant access technologies is giving rise to the need for faster data rates and more data channels to support an ever-increasing number of users and their devices. To meet these demands, circuits must be made smaller and perform faster than ever before. One way manufacturers accomplish this is by leveraging materials that have good dielectric properties (complex permittivity) in the components and devices used to build these circuits (e.g., FR 4 and RF Duroid among others). Another way is to design these components and devices at higher frequency ranges where more bandwidth is available to transfer data more efficiently. However, while manufacturers are quoting good permittivity of the existing materials at low frequencies, these same solutions may not be adequate for designing high-frequency RF and microwave applications.

This application note will examine the issues component and device manufacturers and their engineers will face when designing their solutions in higher frequencies.

Previous Flipbook
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer

This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline ...

Next Flipbook
Testing High Rejection Band Pass Filters for High Frequency Devices
Testing High Rejection Band Pass Filters for High Frequency Devices

The rollout of 70 GHz–80 GHz 5G systems and the subsequent need for more E-band devices (like radar sensors...