Testing High Rejection Band Pass Filters for High Frequency Devices

The rollout of 70 GHz–80 GHz 5G systems and the subsequent need for more E-band devices (like radar sensors) has placed greater importance on using vector network analyzers (VNAs) and their advantages for testing high-frequency components. Many of these active and passive devices will be frequency selectable and include high-rejection components such as duplexers and bandpass filters. VNAs with excellent Spurious Free Dynamic Range (SFDR) measurement capability can characterize and test the out-of-band performance of these high-frequency components during production.

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Material Measurements with Vector Network Analyzers
Material Measurements with Vector Network Analyzers

The increasing popularity of mobile communications, wireless data transfers, and instant access technologie...

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Simulate 5G TCU Drive Test using HILS with Anritsu MT8000A
Simulate 5G TCU Drive Test using HILS with Anritsu MT8000A

Using a HIL platform from dSPACE, together with the Anritsu MT8000A base station emulator, it is possible t...