Testing High Rejection Band Pass Filters for High Frequency Devices

The rollout of 70 GHz–80 GHz 5G systems and the subsequent need for more E-band devices (like radar sensors) has placed greater importance on using vector network analyzers (VNAs) and their advantages for testing high-frequency components. Many of these active and passive devices will be frequency selectable and include high-rejection components such as duplexers and bandpass filters. VNAs with excellent Spurious Free Dynamic Range (SFDR) measurement capability can characterize and test the out-of-band performance of these high-frequency components during production.

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Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer

This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline ...

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Simulate 5G TCU Drive Test using HILS with Anritsu MT8000A
Simulate 5G TCU Drive Test using HILS with Anritsu MT8000A

Using a HIL platform from dSPACE, together with the Anritsu MT8000A base station emulator, it is possible t...