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Empirical BER Characterization of Intra-Pair Skew for PCIe at 64/GTs

This technical note presents an empirical characterization of intra-pair skew for PCI Express (PCIe) at 64 GT/s. With the transition to PAM4 signaling reducing eye margins by more than threefold, systems are increasingly sensitive to skew and signal integrity issues. The study explores how differential-to-common mode conversion and frequency sensitivity impact BER, providing empirical data to validate simulations and guide skew tolerance standards. Anritsu introduces methodologies for testing intra-pair skew that surpass the capabilities of conventional BERTs, delivering critical insights for ensuring compliance and performance in next-generation PCIe systems.

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