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Zeroing in on Active, Passive, and Opto-Electronic Measurements

Webinar Overview:

During this webinar, you will learn why performing VNA measurements of active, passive, and O/E devices become more difficult as you enter into higher frequency domains, as well as techniques that must be adhered to when moving your development up into them. This webinar will also emphasize advanced embedding and de-embedding techniques for measuring various networks.

Previous Video
5G|6G Device Characterization Made Easy
5G|6G Device Characterization Made Easy

Characterizing high-frequency active or passive devices is extremely challenging especially now that more d...

Next Video
Network Extraction and De-embedding Techniques for a Differential PCB Probe
Network Extraction and De-embedding Techniques for a Differential PCB Probe

Learn how to accurately extract, and de-embed, an S4P model for a true odd mode, 70 GHz, differential probe...