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RF/Microwave Test and Component Solutions for New Space

This panel discusses the best device and component solutions for New Space applications that maximize performance and minimize cost/power consumption available from component companies and the best test/measurement solutions to verify their performance. They address the main challenges in these areas along with solutions being introduced to meet industry demands.

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Novel Measurement Techniques for Fundamental 6G Research Using Advanced Instrumentation
Novel Measurement Techniques for Fundamental 6G Research Using Advanced Instrumentation

Advanced 6G research topics like channel sounding, fundamental device characterization and modeling, wavegu...

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5G Smart Surface Test Challenge met by ShockLine™ Modular 2-port VNA
5G Smart Surface Test Challenge met by ShockLine™ Modular 2-port VNA

Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robus...

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