Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties and phase deviation will play a very crucial role for 5G and especially for 6G devices and applications. Although banded measurements have always been used for material testing, 6G technology implementations for material modeling require a broadband VNA solution to characterize the response of the material not only at the frequency of operation, but also for harmonic content as well. This paper will cover the requirements necessary to fully characterize high-frequency materials.
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