Read White Paper

Work Email

First Name

Last Name

Company Name

Country

State

City

Phone Number

Product Family

Industry

Purchasing Timeframe

Anritsu's privacy policy

I have read Anritsu's privacy policy

Opt-in To Future Emails

Thank you!

Error - something went wrong!

Total Harmonic Distortion Measurements

This paper explores the concept of total harmonic distortion (THD), a widely used metric for quantifying the nonlinearity exhibited by a device. THD is commonly defined as the proportion of the root mean square (RMS) sum of harmonic signal amplitudes related to a desired fundamental frequency, in comparison to the RMS sum that encompasses both the fundamental and its harmonics. Discover how the MS464xB VectorStar VNA can be leveraged to enhance setup speed, flexibility, and the availability of intermediary measurements for optimization purposes.

View our complete line of Vector Network Analyzers

Previous Flipbook

5G Smart Surface Test Challenge met by ShockLine™ Modular 2-port VNA

Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robus...

Next Flipbook

Material Measurement Solutions – Focusing on 5G and 6G

Material measurement will become an even more important measurement to be performed on all devices that ca...

Total Harmonic Distortion Measurements

Previous Flipbook

Next Flipbook

Other content in this Stream

Introduction to 110 GHz ONA solution for measuring Opto-electronic devices and components

Advanced 6G research topics like channel sounding, fundamental device characterization and modeling, waveguide banded measurements for amplifiers, broadband receivers, etc.

Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.

Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties

This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW

Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G

This webinar will also emphasize advanced embedding and de-embedding techniques for measuring various networks.

Learn how to accurately extract, and de-embed, an S4P model for a true odd mode, 70 GHz, differential probe (with no grounds), when conducting PC board measurements with a VNA to 70 GHz.

Delta-L is an algorithm developed by Intel for PCB manufacturers for verifying PCB design. Vector Network Analyzer serves an important requirement for all PCB manufacturers in order to be compliant

This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization.

This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline mode since 2x-thru is the most popular network extraction method for splitting into two (2) 1

VECTOR NETWORK ANALYZERS (VNAs) stand shoulder to shoulder with oscilloscopes on the RF/ microwave engineer’s bench in terms of ubiquity and value

Using traditional VNAs to test antennas in OTA chambers generally requires long test port cables

Using VNAs to test OTA RF/μW shielding and propagation on large vehicles generally requires very long test port cables to reach around the vehicles

Antenna testing on outdoor test ranges presents a challenge for traditional VNAs

This paper discusses the historical challenges associated with network measurements over distance

Given unlimited bit depth and sample rate, an IQ capture can perfectly recreate an RF signal from any period in time

In order to understand the application of Type-B network extraction, several steps will be discussed

This application note discusses how to improve high frequency S-parameter measurements by moving the VNA port to the DUT

This application note walks through the tasks of finding more efficient ways to move data