Using traditional VNAs to test antennas in OTA chambers generally requires long test port cables. These cables introduce insertion loss and phase instability into S-parameter measurements especially at microwave frequencies and above. As distances grow, the cable issues become so significant that additional test hardware is required to overcome the issues. This significantly raises the cost and increases the complexity of the antenna test solution.
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1:02:09On-demand Microwave Journal panel discussion: RF/Microwave Test and Component Solutions for New Space
Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.
59:49This webinar will review traditional long cable insertion loss test solutions and the limitations and drawbacks of these methods. It will also discuss an innovative distributed modular VNA architectur
THD is commonly defined as the proportion of the root mean square (RMS) sum of harmonic signal amplitudes related to a desired fundamental frequency.
Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties
This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW
1:02:00Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G
22:17Hosted by MW&RF this informative Q&A webchat with Anritsu discusses one of the primary use cases for a broadband VNA – on-wafer, device characterization
2:07Rubidium is the lowest phase noise (-140 dBc/Hz at 10 GHz output at 10 kHz offset) signal generator which is better than traditional signal generators currently available on the market
Delta-L is an algorithm developed by Intel for PCB manufacturers for verifying PCB design. Vector Network Analyzer serves an important requirement for all PCB manufacturers in order to be compliant
This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline mode since 2x-thru is the most popular network extraction method for splitting into two (2) 1
The increasing popularity of mobile communications, wireless data transfers, and instant access technologies is giving rise to the need for faster data rates and more data channels to support an ever-
This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization.
13:10This three-part series of the VectorStar ME7838G broadband system will describe how the VectorStar ME7838G can be set up to make on-wafer measurements sweeping from 70 kHz to 220 GHz.
22:55Part 2 will continue the discussion with broadband calibration and broadband measurement best practices.
23:08Part 1 of the series will discuss the basic broadband structure, module interface technologies, and the broadband 220 GHz probe
26:53As higher frequencies are considered for automotive radar or for 5G communication systems
6:23ShockLine Vector Network Analyzers Automotive Applications Overview Discover how ShockLine VNAs are utilized for testing automotive applications both inside and outside of the vehicle.
4:11This video introduces the latest addition to the ShockLine family, ME7868A 2-Port VNA system
34:02In this webinar session, you will learn about IMDView™ software that provides the ability to automatically switch between S-parameter measurements and intermodulation characterization using the option
