The E/O and O/E measurement utilities will be discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases, but the measurement principle is the same: use a good VNA calibration to characterize the converting pair and then de-embed the effects of a calibrated/characterized device to analyze the DUT. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels (as high as possible without being nonlinear), IF bandwidth, and averaging in order to optimize the measurements.
Other content in this Stream
10:36Introduction to 110 GHz ONA solution for measuring Opto-electronic devices and components
10:04New PhaseLync enabled ME7869A modular, distributed 2-port VNA helps users make Vector corrected S-parameter measurements over long distances up to 100 meters
2:13Test long cable runs across aircrafts, naval ships, large anechoic chambers, and other tasking environments, with simplicity and accuracy
59:49Advanced 6G research topics like channel sounding, fundamental device characterization and modeling, waveguide banded measurements for amplifiers, broadband receivers, etc.
Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.
1:02:09On-demand Microwave Journal panel discussion: RF/Microwave Test and Component Solutions for New Space
59:49This webinar will review traditional long cable insertion loss test solutions and the limitations and drawbacks of these methods. It will also discuss an innovative distributed modular VNA architectur
THD is commonly defined as the proportion of the root mean square (RMS) sum of harmonic signal amplitudes related to a desired fundamental frequency.
22:17Hosted by MW&RF this informative Q&A webchat with Anritsu discusses one of the primary use cases for a broadband VNA – on-wafer, device characterization
4:11This video introduces the latest addition to the ShockLine family, ME7868A 2-Port VNA system
Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties
2:32Anritsu, presents our VectorStar ME7838G4 4-port broadband vector network analyzer system with the new spectrum analyzer option. VectorStar offers, the world’s first simultaneous 4-port differential S
The increasing popularity of mobile communications, wireless data transfers, and instant access technologies is giving rise to the need for faster data rates and more data channels to support an ever-
This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW
1:02:00Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G
The demand for faster wired and wireless communication speeds, higher resolution automotive radar, and greater bandwidth for networking infrastructure is driving trends toward higher data rates.
23:08Part 1 of the series will discuss the basic broadband structure, module interface technologies, and the broadband 220 GHz probe
22:55Part 2 will continue the discussion with broadband calibration and broadband measurement best practices.
13:10This three-part series of the VectorStar ME7838G broadband system will describe how the VectorStar ME7838G can be set up to make on-wafer measurements sweeping from 70 kHz to 220 GHz.