The E/O and O/E measurement utilities will be discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases, but the measurement principle is the same: use a good VNA calibration to characterize the converting pair and then de-embed the effects of a calibrated/characterized device to analyze the DUT. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels (as high as possible without being nonlinear), IF bandwidth, and averaging in order to optimize the measurements.
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10:36Introduction to 110 GHz ONA solution for measuring Opto-electronic devices and components
59:49Advanced 6G research topics like channel sounding, fundamental device characterization and modeling, waveguide banded measurements for amplifiers, broadband receivers, etc.
Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.
THD is commonly defined as the proportion of the root mean square (RMS) sum of harmonic signal amplitudes related to a desired fundamental frequency.
Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties
This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW
1:02:00Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G
1:02:39This webinar will also emphasize advanced embedding and de-embedding techniques for measuring various networks.
42:26Learn how to accurately extract, and de-embed, an S4P model for a true odd mode, 70 GHz, differential probe (with no grounds), when conducting PC board measurements with a VNA to 70 GHz.
Delta-L is an algorithm developed by Intel for PCB manufacturers for verifying PCB design. Vector Network Analyzer serves an important requirement for all PCB manufacturers in order to be compliant
This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization.
This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline mode since 2x-thru is the most popular network extraction method for splitting into two (2) 1
VECTOR NETWORK ANALYZERS (VNAs) stand shoulder to shoulder with oscilloscopes on the RF/ microwave engineer’s bench in terms of ubiquity and value
Using traditional VNAs to test antennas in OTA chambers generally requires long test port cables
Using VNAs to test OTA RF/μW shielding and propagation on large vehicles generally requires very long test port cables to reach around the vehicles
Antenna testing on outdoor test ranges presents a challenge for traditional VNAs
This paper discusses the historical challenges associated with network measurements over distance
Given unlimited bit depth and sample rate, an IQ capture can perfectly recreate an RF signal from any period in time
In order to understand the application of Type-B network extraction, several steps will be discussed
This application note discusses how to improve high frequency S-parameter measurements by moving the VNA port to the DUT