The E/O and O/E measurement utilities will be discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases, but the measurement principle is the same: use a good VNA calibration to characterize the converting pair and then de-embed the effects of a calibrated/characterized device to analyze the DUT. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels (as high as possible without being nonlinear), IF bandwidth, and averaging in order to optimize the measurements.
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59:49Advanced 6G research topics like channel sounding, fundamental device characterization and modeling, waveguide banded measurements for amplifiers, broadband receivers, etc.
1:02:09On-demand Microwave Journal panel discussion: RF/Microwave Test and Component Solutions for New Space
Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.
59:49This webinar will review traditional long cable insertion loss test solutions and the limitations and drawbacks of these methods. It will also discuss an innovative distributed modular VNA architectur
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Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties
This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW
1:02:00Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G
22:17Hosted by MW&RF this informative Q&A webchat with Anritsu discusses one of the primary use cases for a broadband VNA – on-wafer, device characterization
2:07Rubidium is the lowest phase noise (-140 dBc/Hz at 10 GHz output at 10 kHz offset) signal generator which is better than traditional signal generators currently available on the market
Delta-L is an algorithm developed by Intel for PCB manufacturers for verifying PCB design. Vector Network Analyzer serves an important requirement for all PCB manufacturers in order to be compliant
This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline mode since 2x-thru is the most popular network extraction method for splitting into two (2) 1
The increasing popularity of mobile communications, wireless data transfers, and instant access technologies is giving rise to the need for faster data rates and more data channels to support an ever-
This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization.
13:10This three-part series of the VectorStar ME7838G broadband system will describe how the VectorStar ME7838G can be set up to make on-wafer measurements sweeping from 70 kHz to 220 GHz.
22:55Part 2 will continue the discussion with broadband calibration and broadband measurement best practices.
23:08Part 1 of the series will discuss the basic broadband structure, module interface technologies, and the broadband 220 GHz probe
26:53As higher frequencies are considered for automotive radar or for 5G communication systems
6:23ShockLine Vector Network Analyzers Automotive Applications Overview Discover how ShockLine VNAs are utilized for testing automotive applications both inside and outside of the vehicle.
4:11This video introduces the latest addition to the ShockLine family, ME7868A 2-Port VNA system