This application note walks through the tasks of finding more efficient ways to move data. One of the challenges engineers face is the volume of data and the channel bandwidth that is needed to move such large amounts of data. It is no secret and trends are showing the only real way to proceed, is to move the frequency of operation higher into the millimeter-wave (mmWave) bands. This application note will discuss why power measurements for a device characterization are important, what users should know about: calibration, challenges with broadband power calibrations, technologies for calibrations, and the advantage of using the Anritsu Power Master MA24510A along with a performance overview and test setup and procedures.
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10:36Introduction to 110 GHz ONA solution for measuring Opto-electronic devices and components
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4:11This video introduces the latest addition to the ShockLine family, ME7868A 2-Port VNA system
Material measurement will become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties
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22:55Part 2 will continue the discussion with broadband calibration and broadband measurement best practices.
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