×

Watch Now

First Name
Last Name
Company Name
Country
State
City
Phone Number
Product Family
Industry
Purchasing Timeframe
Anritsu's privacy policy
 
I have read Anritsu's privacy policy
!
Thank you!
Error - something went wrong!

400G Post FEC BER and Jitter Tolerance Test for Physical Layer Chip and Module Type

High-speed and large-capacity transmission standards using PAM4 signaling, such as 400 GbE, stipulate the use of Forward Error Correction (FEC) to assure transmission quality.  Consequently, jitter tolerance tests for SERDES, DSP, and CDR used by transceivers are required at both pre-FEC evaluations of bit error rate performance as well as at correctable/uncorrectable FEC symbol error performance. View this webinar to learn the following:

  • Latest 400G/800G Market trends  
  • Challenges of high speed PAM4 transmission
  • Outline of FEC (Forward Error Correction) 
  • Anritsu MP1900A physical layer test solutions with the FEC Analysis
  • Jitter Tolerance test based on FEC uncorrectable error criteria
Previous Flipbook
PCIe® 6.0 Testing for a New Generation
PCIe® 6.0 Testing for a New Generation

This paper outlines the enhanced PCIe 6.0 technologies, such as PAM4, Forward Error Correction (FEC) and li...

Next Flipbook
The FEC Pattern Generation MU196020A-042 Quick Start Guide
The FEC Pattern Generation MU196020A-042 Quick Start Guide

FEC is a key technology for assuring the quality of large-capacity transmissions, such as 100 and 400 GbE.

×

Want a head start on tomorrow's technologies? Sign up for monthly insights

First Name
Last Name
Company Name
Country
!
Thank you!
Error - something went wrong!