Hosted by MW&RF this informative Q&A webchat with Anritsu discusses one of the primary use cases for a broadband VNA – on-wafer, device characterization. Discrete devices (i.e., transistors, capacitors, passive structures, etc.) need to be measured across a wide frequency range (ideally DC to >>110 GHz), to generate accurate parametric models. Listen in and learn more benefits! MS46
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