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Making Long Distance Measurements Simple

This webinar will review traditional long cable insertion loss test solutions and the limitations and drawbacks of these methods. It will also discuss an innovative distributed modular VNA architecture that can simplify the setup and measurement for both measured dynamic range and group delay.

Previous Video
Stress Testing PCIe 6.0 FLIT-based Forward Error Correction
Stress Testing PCIe 6.0 FLIT-based Forward Error Correction

PCIe 6.0 introduces Flow Control Unit (FLIT) encoding to allow forward error correction (FEC) on fixed-size...

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The New Era of Wi-Fi Wi-Fi 6E, The Enterprise & The Evolution Towards Wi-Fi 7
The New Era of Wi-Fi Wi-Fi 6E, The Enterprise & The Evolution Towards Wi-Fi 7

Wi-Fi is undoubtedly one of the biggest industries in the connectivity space. With a predicted market forec...