The E/O and O/E measurement utilities will be discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases, but the measurement principle is the same: use a good VNA calibration to characterize the converting pair and then de-embed the effects of a calibrated/characterized device to analyze the DUT. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels (as high as possible without being nonlinear), IF bandwidth, and averaging in order to optimize the measurements.
As more people become accustomed to technology, the demand for data throughput has increased exponentially ...
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