The E/O and O/E measurement utilities will be discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases, but the measurement principle is the same: use a good VNA calibration to characterize the converting pair and then de-embed the effects of a calibrated/characterized device to analyze the DUT. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels (as high as possible without being nonlinear), IF bandwidth, and averaging in order to optimize the measurements.
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